PRESENTATION

Advances in PIC Testing: Challenges and Measurement Needs from R&D to Volume Production

Photonic integrated circuits are rapidly moving from R&D to industrial deployment, raising expectations for testing and characterisation. This presentation reviews the PIC testing landscape, the measurement technologies available today, and what they reveal about device performance. It focuses on user challenges and needs across both research and volume production environments, where requirements differ in speed, performance, automation, and data processing. Recent solutions and example PIC measurements will be presented.