Giacomo has more than 24 years of experience in the semiconductor industry. After completing his studies in Electronics, he began his career in semiconductor equipment companies, focusing on testing and automation solutions. He recently joined CREA, part of the Advantest Group, where he is responsible for marketing and business development for power semiconductor test equipment.
Wide bandgap (WBG) semiconductors such as silicon carbide (SiC) and gallium nitride (GaN) enable high power conversion efficiency but introduce fast switching behaviour and elevated parasitic sensitivity, creating significant challenges for accurate and reliable device testing. A cost effective test solution minimizes dependence on high cost instrumentation while improving measurement accuracy and repeatability. This approach enhances test fidelity, scalability, and overall cost of test efficiency, supporting the volume manufacturing requirements of next generation WBG power devices.